Skip to content

AZ 5214E process recipe

AZ 5214E is a novolak/DNQ (diazonaphthoquinone) positive photoresist from Merck's AZ line that is almost exclusively used in image-reversal (IR) mode: a special crosslinking agent activated by a reversal bake makes exposed areas insoluble, so a subsequent flood exposure and standard positive development yields a negative-tone image with a re-entrant (undercut) sidewall profile ideally suited to lift-off metallization.

https://nanyte.com/photoresists/az-5214e · last updated 2026-07-10

At a glance
Manufacturer
MicroChemicals / Merck Performance Materials GmbH
Tone
image reversal
Chemistry
DNQ-novolak
Thickness
1.1–2.0 µm
Developer
AZ 340 (metal-ion-containing) or AZ 726 MIF (metal-ion-free)
Applications
Lift-off · Image reversal
Lift-offSuitable for

Cross-checked — two independent extractions agree.

01 / Coating

Spin coating

AZ 5214E is spin-coated to 1.1–2.0 µm. The curve below is redrawn from the manufacturer's published data — read your target thickness off the vertical axis and take the matching spin speed as a starting point.

Spin curve for AZ 5214E: film thickness in µm against spin speed in rpm.0.001.02.03.02k3k4k5k6kSPIN SPEED (rpm)THICKNESS (µm)
Data points
AZ 5214E — film thickness (µm) by spin speed (rpm)
Seriesrpmµm
as supplied20002.0
30001.6
40001.4
50001.3
60001.1

Values are the manufacturer's starting points, not a guarantee; verify on your own tool. Characterize on-tool.

numeric table "FILM THICKNESS [µm] as FUNCTION of SPIN SPEED (characteristically)", p.2 of MicroChemicals/Merck AZ 5214E Technical Data Sheet

Redrawn from the manufacturer's published data — hover to read values between points, click to pin.

Datasheet gives no accel/dispense/edge-bead procedure beyond naming AZ EBR Solvent for dilution/edge-bead removal (Processing Guidelines table, p.3). 4000 rpm (1.40 µm) is bolded in the source table, suggesting it as the reference/typical spin speed, though the datasheet does not explicitly label it as such.

Adhesion
HMDS not required — HMDS/adhesion promotion is not mentioned anywhere in this datasheet.
02 / Bake

Soft bake

Soft bake
110 °C · 50 s · hotplate

SOURCE: Processing Guidelines table, p.3: "Prebake 110°C, 50", hotplate"

03 / Exposure

Exposure dose

The manufacturer does not publish a clearing dose for AZ 5214E. Determine it with a dose array on your own tool.

As published
Exposure is stated only qualitatively: "broadband and monochromatic h- and i-line" (Processing Guidelines, p.3), with a spectral sensitivity range of 310–420 nm (Physical & Chemical Properties table, p.2). No absolute imagewise exposure dose in mJ/cm² is published.
Post-exposure bake
120 °C · 2 min
Flood exposure
200 mJ/cm²

Not published for this resist: Dose at 365 nm, Dose at 405 nm — characterize on-tool.

04 / Development

Development

Developer
AZ 340 (metal-ion-containing) or AZ 726 MIF (metal-ion-free)
Dilution
AZ 340 used 1:5 diluted; AZ 726 MIF used as supplied
Method
AZ 340: tank or spray; AZ 726 MIF: puddle
Developer family
TMAH-based

Not published for this resist: Time, Rinse — characterize on-tool.

SOURCE: Processing Guidelines table, p.3: "Development AZ 340, 1:5 (tank, spray) or AZ 726 (puddle)"

05 / Post-processing

Hard bake, etch & strip

Hard bake
120 °C · 50 s
Stripper
AZ 100 Remover, concentrate (Processing Guidelines table, p.3: "Removal AZ 100 Remover, conc.")
Storage
Store in sealed original containers, protected from light and heat, between 0°C and 25°C; brief excursions to -5°C or +30°C for up to 24 hours do not adversely affect properties. Shelf life is limited; expiration date is printed on the bottle label as [year/month/day]. (Handling Advises, p.3)

Not published for this resist: Descum, Etch resistance — characterize on-tool.

SOURCE: Processing Guidelines table, p.3: "Postbake 120°C, 50s hotplate (optional)"

06 / Applications

Where it's used

Lift-offImage reversal

AZ 5214E is a positive DNQ/novolak resist that is almost exclusively run in image-reversal mode for lift-off, producing a negative (re-entrant) sidewall profile instead of the ~75-85° positive slope of standard positive processing. The reversal-bake temperature is the single most process-sensitive parameter: it must be individually tuned (typically 115-125°C) and held within ±1°C, since a few degrees too high causes thermal crosslinking even in unexposed regions and destroys the pattern; the datasheet gives a explicit calibration procedure for finding it. By contrast, the flood exposure step is deliberately forgiving (150-500 mJ/cm² all work). A T-shaped (overhanging-lip) lift-off profile can also be produced with a modified sequence: light flood exposure before the reversal bake, then normal imagewise exposure and development.

07 / Sources

Sources & disclaimer

Research using this resist
  1. Škriniarová et al.. Standard AZ 5214E photoresist in laser interference and EBDW lithographies. Vacuum (2015). doi:10.1016/j.vacuum.2014.09.012
    AZ 5214E run as an e-beam resist, not just UV
  2. Elshenety et al.. High thickness material lift-off using multi-layer photoresist. Journal of Micromechanics and Microengineering (2025). doi:10.1088/1361-6439/adac6b
    Stacked multi-layer 5214E lifts off more than 6 µm of electroplated Cu — 4× its single-coat thickness

Manufacturer datasheet values are starting points; optimal parameters depend on your substrate, equipment and environment. Product names and trademarks belong to their respective owners. NANYTE is not affiliated with the manufacturers listed. Last updated 2026-07-10.

Cite this recipe

NANYTE. "AZ 5214E process recipe." NANYTE Photoresist Library. https://nanyte.com/photoresists/az-5214e. Accessed 2026-07-10.

Ready to run this process on your own tool?Book a demo →

Expose it at 365 and 405 nm

NANYTE BEAM is a desktop maskless lithography system with software-selectable dual-wavelength exposure and 16-bit grayscale — no photomask, no mask cost, same-day iteration.

Book a demo

Improve this recipe

Run this resist in your lab? Send us what actually works, or flag a value that's wrong. No account, no email needed — a handle and affiliation are optional and become your credit line. Every contribution is checked against published sources before it appears.