https://nanyte.com/photoresists/lor-5a · last updated 2026-07-10
- Manufacturer
- MicroChem (MCC) — now Kayaku Advanced Materials
- Tone
- Not photoimageable (underlayer)
- Chemistry
- Ancillary (not photoimageable)
- Thickness
- 0.5–1.0 µm
- Exposure dose
- Not exposed — dissolves in developer
- Developer
- Applications
- Lift-off
Cross-checked — two independent extractions agree.
Spin coating
LOR 5A is spin-coated to 0.5–1.0 µm. The curve below is redrawn from the manufacturer's published data — read your target thickness off the vertical axis and take the matching spin speed as a starting point.
Data points
| Series | rpm | µm |
|---|---|---|
| LOR 5A | 1000 | 0.98 |
| 2000 | 0.67 | |
| 3000 | 0.55 | |
| 4000 | 0.47 |
Values are the manufacturer's starting points, not a guarantee; verify on your own tool. Characterize on-tool. Series digitized from a published figure were independently cross-checked by a second blind read; treat those values as approximate (±10 %).
read from figure "Spin Speed vs Thickness - Intermediate Films", p.5 of MicroChem "LOR and PMGI Resists" datasheet. This figure plots five grades: LOR 7B (blue square), LOR 5A (red circle), LOR 5B (green x), a COMBINED 'LOR 3A, LOR 3B' trace (black diamond), and SF6 (purple triangle). LOR 5A was identified and read as the red-circle series specifically because it has its OWN distinct legend entry ('LOR 5A', not grouped with any other grade) and its own separate curve, clearly offset above the neighboring LOR 5B (green) and well above the combined LOR 3A/3B (black) trace in the same chart — i.e. this is NOT the combined multi-grade series that caused a misread on a sibling LOR 3A recipe in this project. Only 4 markers are plotted for LOR 5A (1000/2000/3000/4000 rpm); no 1500/2500/3500 rpm points exist for this series (unlike SF6, which has more points in the same figure). Read from a rendered PNG crop of the chart at native resolution; an eyeball read, ±10-15% plausible per-point error, not a numeric table. Chart footnote (p.5): 'Products were soft-baked at 180 ºC for 3 min' — the measurement condition for the plotted films, not a stated LOR-5A-specific process bake recommendation.
Only 4 spin-speed points (1000/2000/3000/4000 rpm) are plotted for LOR 5A; extrapolation below 1000 or above 4000 rpm is not supported by the chart. The page's boxed 'RECOMMENDED COATING PARAMETERS' (dispense 5 ml on a 150 mm Si wafer, dynamic dispense 3-5 s at 300-500 rpm, acceleration 10,000 rpm/s, terminal spin speed 3,000 rpm, spin time 45 s, EBR PG for edge-bead removal) appears once for the whole Technical Data page (p.5) and is not stated to be grade-specific, so it is recorded here as general page-level guidance rather than a confirmed LOR-5A parameter. Separately, general text (p.2) states spin speeds of 2,500-4,500 rpm give 'maximum coating uniformity' across the LOR/PMGI line, with lower speeds favored for larger or irregular/topographic substrates.
- Adhesion
Soft bake
- Soft bake
- Not published — characterize on-tool
- Notes
SOURCE: p.3 ("Soft-bake/Prebake Process") and p.5 chart footnote, MicroChem "LOR and PMGI Resists" datasheet
Exposure
LOR 5A is not photoimageable. It is not exposed at all — it is coated beneath an imaged top resist and undercut laterally during development. See the development step below.
Development
- Developer
Not published for this resist: Dilution, Time, Method, Rinse — characterize on-tool.
SOURCE: p.1 ("Compatible with TMAH and metal-ion bearing developers"), p.4 ("Development Process"), and p.6 Product Selection Guide (Developer Compatibility row), MicroChem "LOR and PMGI Resists" datasheet
Hard bake, etch & strip
- Stripper
- Storage
Not published for this resist: Hard bake, Descum, Etch resistance — characterize on-tool.
Where it's used
LOR 5A is an ancillary, non-photoimageable PMGI-type (polydimethylglutarimide) underlayer: it is spin-coated beneath a conventional photoresist and never exposed itself, so it carries no dose, tone, or lithographic pattern of its own — only the imaging resist above it is exposed and developed. The undercut geometry that enables clean metal lift-off is a develop-time and pre-bake-temperature-controlled dimension, not a lithographic one: the datasheet states pre-bake temperature has 'the greatest influence on undercut rate,' with pre-bake time, the imaging resist's own exposure dose, developer choice, develop mode, and develop time as secondary factors. No grade-specific bake-temperature-vs-dissolution-rate curve is published for LOR 5A — the only such curves in this document (Figures 5a/5b) are for LOR 10B — so LOR 5A's own undercut rate cannot be read off this datasheet and should be characterized on-tool. In practice, too little undercut leaves an insufficient re-entrant profile, so evaporated or sputtered metal bridges over the sidewall and lift-off fails or leaves ragged edges; too much undercut can collapse the unsupported span of imaging resist over the gap, degrading pattern fidelity — both failure modes are tuned via pre-bake temperature/time and develop time, not exposure.
Sources & disclaimer
- MicroChem (MCC) — now Kayaku Advanced Materials — LOR 5A datasheet (Rev. A (printed at the bottom of p.7; no other date is printed anywhere in the document)) · accessed 2026-07-10
- Chen. A lift-off process for high resolution patterns using PMMA/LOR resist stack. Microelectronic Engineering (2004). doi:10.1016/j.mee.2004.02.053Sub-100 nm lift-off geometry demonstrated with a PMMA/LOR resist bilayer.
Manufacturer datasheet values are starting points; optimal parameters depend on your substrate, equipment and environment. Product names and trademarks belong to their respective owners. NANYTE is not affiliated with the manufacturers listed. Last updated 2026-07-10.
